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SEM analysis of ionizing radiation effects in an analog to digital converter /AD571/The considered investigation is concerned with the study of the total-dose degradation mechanisms in an IIL analog to digital (A/D) converter. The A/D converter is a 10 digit device having nine separate functional units on the chip which encompass several hundred transistors and circuit elements. It was the objective of the described research to find the radiation sensitive elements by a systematic search of the devices on the LSI chip. The employed technique using a scanning electron microscope to determine the functional blocks of an integrated circuit which are sensitive to ionizing radiation and then progressively zeroing in on the soft components within those blocks, proved extremely successful on the AD571. Four functional blocks were found to be sensitive to radiation, including the Voltage Reference, DAC, IIL Clock, and IIL SAR.
Document ID
19820034751
Acquisition Source
Legacy CDMS
Document Type
Reprint (Version printed in journal)
Authors
Gauthier, M. K.
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Perret, J.
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Evans, K. C.
(California Institute of Technology, Jet Propulsion Laboratory, Pasadena CA, United States)
Date Acquired
August 10, 2013
Publication Date
December 1, 1981
Subject Category
Electronics And Electrical Engineering
Accession Number
82A18286
Funding Number(s)
CONTRACT_GRANT: NAS7-100
Distribution Limits
Public
Copyright
Other

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