Improved adhesion of Ni films on X-ray damaged polytetrafluoroethyleneThe considered investigation shows that the adhesion of evaporated Ni on polytetrafluoroethylene (PTFE) is enhanced by irradiating the PTFE surface prior to evaporation. Evidence obtained with the aid of X-ray photoelectron spectroscopy is presented concerning the association of the enhanced adhesion with an interfacial chemical reaction. Evaporated Ni clearly adheres better to the X-ray damaged PTFE surface than to the undamaged surface. There is evidence that the improved adhesion is not related to the Ni-C bond, but rather to the NiF2. A possible mechanism which may be consistent with the data is the formation of a F-Ni-C complex, where C is a member of the polymer chain.
Document ID
19820037211
Acquisition Source
Legacy CDMS
Document Type
Conference Paper
Authors
Wheeler, D. R. (NASA Lewis Research Center Cleveland, OH, United States)
Pepper, S. V. (NASA Lewis Research Center Cleveland, OH, United States)