Analysis of aging data on SAW oscillators

Test oscillators including delay lines and resonators in the 300-400 MHz range have been investigated with reference to the long-term stability (aging) characteristics. All devices were fabricated on rotated Y-cut quartz plates (40 deg), and either gold or platinum metallization was used; all packages were high-quality hermetic enclosures, and the mounting was strictly mechanical, with no organics or silicone rubbers used. It is shown that drift of less than 2 ppm in the first year can be obtained on a significant fraction of the devices when reasonably clean packages are used. The data also suggest that the transducer metallization (at least for aluminum) is very likely the source of the relaxation mechanism that causes the frequency drift.