The suppression of charged-particle-induced noise in infrared detectors

A d.c.-coupled transimpedance amplifier/pulse suppression circuit designed to remove charged-particle-induced noise from infrared detectors is described. Noise spikes produced by single particle events are large and have short rise times, and can degrade the performance of an infrared detector in moderate radiation environments. The use of the suppression circuit improves the signal-to-noise ratio by a factor of 1.6:1, which corresponds to a reduction in required observing time by a factor of about 2.6.