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Deep impurity trapping concepts for power semiconductor devicesHigh voltage semiconductor switches using deep impurity doped silicon now appear feasible for high voltage (1-100 kV), high power (10 Kw) switching and protection functions for future space power applications. Recent discoveries have demonstrated several practical ways of gating deep impurity doped silicon devices in planar configurations and of electrically controlling their characteristics, leading to a vast array of possible circuit applications. A new family of semiconductor switching devices and transducers are possible based on this technology. New deep impurity devices could be simpler than conventional p-n junction devices and yet use the same basic materials and processing techniques. In addition, multiple functions may be possible on a single device as well as increased ratings.
Document ID
19830007606
Acquisition Source
Legacy CDMS
Document Type
Conference Paper
Authors
Sundberg, G. R.
(NASA Lewis Research Center Cleveland, OH, United States)
Date Acquired
August 11, 2013
Publication Date
January 1, 1982
Publication Information
Publication: R and D Associates Proc. of the AFOSR Spec. Conf. on Prime-Power for High Energy Space Systems, Vol. 2
Subject Category
Solid-State Physics
Accession Number
83N15877
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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