NASA Logo

NTRS

NTRS - NASA Technical Reports Server

Back to Results
Multiwavelength analyzer for the determination of diffusion lengthsThe minority carrier diffusion length Ln in the base or substrate region is an important parameter which governs a solar cell's performance. The present investigation is concerned with the development of a multiwavelength analyzer (MWA) technique for the nondestructive spatial testing of polycrystalline solar cells. The MWA method is based on the utilization of the short-circuit current generated by two or more light-emitting diodes (LEDs) operating at different wavelengths and modulated 180 deg out-of-phase. For a determination of Ln by the MWA technique, it is necessary to know the value of the absorption coefficient.
Document ID
19830067394
Acquisition Source
Legacy CDMS
Document Type
Reprint (Version printed in journal)
Authors
Stafsudd, O. M.
(California Univ. Los Angeles, CA, United States)
Davis, G. E.
(California Univ. Los Angeles, CA, United States)
Jansen, M.
(California, University Los Angeles, CA, United States)
Date Acquired
August 11, 2013
Publication Date
September 1, 1983
Publication Information
Publication: Solar Cells
Volume: 9
ISSN: 0379-6787
Subject Category
Instrumentation And Photography
Accession Number
83A48612
Distribution Limits
Public
Copyright
Other

Available Downloads

There are no available downloads for this record.
No Preview Available