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A Ka-band GaAs monolithic phase shifterThe design and performance of a GaAs monolithic 180-degree one-bit switched line phase shifter test circuit for Ka-band operation is presented. A self-aligned gate (SAG) fabrication technique is also described that reduces resistive parasitics in the switching FET's. Over the 27.5-30 GHz band, typical measured differential insertion phase is within 10-20 deg of the ideal time delay characteristic. Over the same band, the insertion loss for the SAG phase shifter is about 2.5-3 dB per bit. The SAG fabrication technique holds promise in reducing phase shifter insertion loss to about 1.5 dB/bit for 30-GHz operation.
Document ID
19840035584
Acquisition Source
Legacy CDMS
Document Type
Reprint (Version printed in journal)
Authors
Sokolov, V.
(Honeywell Corporate Research Center Bloomington, MN, United States)
Geddes, J. J.
(Honeywell Corporate Research Center Bloomington, MN, United States)
Contolatis, A.
(Honeywell Corporate Research Center Bloomington, MN, United States)
Bauhahn, P. E.
(Honeywell Corporate Research Center Bloomington, MN, United States)
Chao, C.
(Honeywell Corporate Technology Center Bloomington, MN, United States)
Date Acquired
August 12, 2013
Publication Date
December 1, 1983
Publication Information
Publication: IEEE Transactions on Microwave Theory and Techniques
Volume: MTT-31
ISSN: 0018-9480
Subject Category
Electronics And Electrical Engineering
Accession Number
84A18371
Funding Number(s)
CONTRACT_GRANT: NAS3-23356
Distribution Limits
Public
Copyright
Other

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