Exact modeling of lineshape and wavenumber variations for off-axis detectors in Fourier transform spectrometers (FTS) sensor systems

The utilization of detector arrays in the focal planes of FTS sensor systems allows simultaneous spectral and spatial measurements. However, spectral lineshapes and wavenumber locations depend upon the size and location of the detector elements with respect to the Haidinger fringe pattern of the FTS sensor. These spectral distortions can be generalized as a shift and shape change of the FTS sensor lineshape. Depending on the distortions that can be tolerated, a degree of field-widening can be obtained for a given Haidinger fringe pattern. An exact model for predicting the FTS lineshape distortions is presented. The model is applied to several contemporary applications in order to quantify the magnitude of distortions to be expected.