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Analytical redundancy and the design of robust failure detection systemsThe Failure Detection and Identification (FDI) process is viewed as consisting of two stages: residual generation and decision making. It is argued that a robust FDI system can be achieved by designing a robust residual generation process. Analytical redundancy, the basis for residual generation, is characterized in terms of a parity space. Using the concept of parity relations, residuals can be generated in a number of ways and the design of a robust residual generation process can be formulated as a minimax optimization problem. An example is included to illustrate this design methodology. Previously announcedd in STAR as N83-20653
Document ID
19840056958
Acquisition Source
Legacy CDMS
Document Type
Reprint (Version printed in journal)
Authors
Chow, E. Y.
(Schlumberger-Doll Research Ridgefield, CT, United States)
Willsky, A. S.
(MIT Cambridge, MA, United States)
Date Acquired
August 12, 2013
Publication Date
July 1, 1984
Publication Information
Publication: IEEE Transactions on Automatic Control
Volume: AC-29
ISSN: 0018-9286
Subject Category
Cybernetics
Accession Number
84A39745
Funding Number(s)
CONTRACT_GRANT: NGL-22-009-124
CONTRACT_GRANT: N00014-77-C-0224
Distribution Limits
Public
Copyright
Other

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