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Far-infrared embedding impedance measurementsA technique which allows the measurement of detector embedding impedance has been developed. By using a bismuth microbolometer as a variable resistance load the impedance of one element in a bow-tie antenna array operating at 94 GHz was inferred. The technique is frequency insensitive, and could be used throughout the far-infrared.
Document ID
19840062035
Acquisition Source
Legacy CDMS
Document Type
Reprint (Version printed in journal)
External Source(s)
doi:10.1007/BF01009590
Authors
Neikirk, D. P. (California Inst. of Tech. Pasadena, CA, United States)
Rutledge, D. B. (California Institute of Technology Pasadena, CA, United States)
Date Acquired
August 12, 2013
Publication Date
July 1, 1984
Publication Information
Publication: International Journal of Infrared and Millimeter Waves
Volume: 5
ISSN: 0195-9271
Subject Category
Instrumentation And Photography
Accession Number
84A44822
Funding Number(s)
CONTRACT_GRANT: DE-AM03-76SF-00010
CONTRACT_GRANT: DOE TASK IIA
CONTRACT_GRANT: DAAG29-82-K-0165
Distribution Limits
Public
Copyright
Other

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