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Laser Schlieren Crystal-Growth ImagerCrystal observed as it grows from melt with aid of laser schlieren imaging. Observation method allows entire perimeter of growing crystal to be inspected. Isolated crystal facets examined, convection flows and temperature and concentration gradients revealed. Method does not require contact with, or proximity to, crystal.
Document ID
19850000326
Acquisition Source
Legacy CDMS
Document Type
Other - NASA Tech Brief
Authors
Owen, R. B.
Johnston, M. H.
Date Acquired
August 12, 2013
Publication Date
January 1, 1986
Publication Information
Publication: NASA Tech Briefs
Volume: 9
Issue: 3
ISSN: 0145-319X
Subject Category
Physical Sciences
Report/Patent Number
MFS-28060
Accession Number
85B10326
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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