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Measuring Thermal Diffusivity of Molten SemiconductorsThermal diffusivity of molten and solid mercury cadmium telluride measured with aid of new apparatus. Knowledge gained from such measurements help efforts to grow high-quality single crystals of this semiconductor for use in infrared detectors: Without knowledge of thermal diffusivity, difficult to control growth rate of solid from molten material.
Document ID
19850000350
Acquisition Source
Legacy CDMS
Document Type
Other - NASA Tech Brief
Authors
Crouch, R.
(Purdue University)
Holland, L.
Taylor, R. E.
Date Acquired
August 12, 2013
Publication Date
January 1, 1986
Publication Information
Publication: NASA Tech Briefs
Volume: 9
Issue: 3
ISSN: 0145-319X
Subject Category
Materials
Report/Patent Number
MFS-28047
Accession Number
85B10350
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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