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Measuring Thermoelectric Properties AutomaticallyMicrocomputer-controlled system speeds up measurements of Hall voltage, Seebeck coefficient, and thermal diffusivity in semiconductor compounds for thermoelectric-generator applications. With microcomputer system, large data base of these parameters gathered over wide temperature range. Microcomputer increases measurement accuracy, improves operator productivity, and reduces test time.
Document ID
19850000488
Acquisition Source
Legacy CDMS
Document Type
Other - NASA Tech Brief
Authors
Chmielewski, A.
(Caltech)
Wood, C.
(Caltech)
Date Acquired
August 12, 2013
Publication Date
March 1, 1986
Publication Information
Publication: NASA Tech Briefs
Volume: 9
Issue: 4
ISSN: 0145-319X
Subject Category
Materials
Report/Patent Number
NPO-16507
Accession Number
85B10488
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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