Isopachic contouring of opaque plates

Contour maps of change of thickness of opaque plates subjected to external loads are obtained using holographic interferometry in conjunction with the moire effect. A simple holographic-interferometry arrangement is used first to obtain contour maps of the out-of-plane displacements of the two sides of the object. Carrier patterns of equal magnitude but opposite signs are added to these contours. Superposition of the reconstructed holograms of the two sides produces a pattern of additive-moire fringes, which are contours of change of thickness. Effects of midplane warpage of the loaded specimen are cancelled. Sensitivity is lambda/2 per fringe order, contrast of the isopachic-fringe pattern is excellent, and the process is compatible with a mechanical-testing-machine environment.