Analysis of an infinite array of rectangular microstrip patches with idealized probe feeds

A solution is presented to the problem of an infinite array of microstrip patches fed by idealized current probes. The input reflection coefficient is calculated versus scan angle in an arbitrary scan plane, and the effects of substrate parameters and grid spacing are considered. It is pointed out that even when a Galerkin method is used the impedance matrix is not symmetric due to phasing through a unit cell, as required for scanning. The mechanism by which scan blindness can occur is discussed. Measurement results are presented for the reflection coefficient magnitude variation with angle for E-plane, H-plane, and D-plane scans, for various substrate parameters. Measured results from waveguide simulators are also presented, and the scan blindness phenomenon is observed and discussed in terms of forced surface waves and a modified grating lobe diagram.