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Field funneling and range straggling in partially depleted silicon surface-barrier detectorsThe effects of field funneling and range straggling have been quantitatively observed in the measurement of charge collected from alpha-particle tracks in silicon surface-barrier charged-particle detectors. The method described may be used for the straight-forward measurement of charge collection from heavy ions in these and other semiconductor devices.
Document ID
19850036405
Acquisition Source
Legacy CDMS
Document Type
Reprint (Version printed in journal)
Authors
Zoutendyk, J. A.
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Malone, C. J.
(California Institute of Technology, Jet Propulsion Laboratory, Pasadena CA, United States)
Date Acquired
August 12, 2013
Publication Date
December 1, 1984
Publication Information
Publication: IEEE Transactions on Nuclear Science
Volume: NS-31
ISSN: 0018-9499
Subject Category
Solid-State Physics
Accession Number
85A18556
Distribution Limits
Public
Copyright
Other

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