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Total dose effects in the 54HC family of microcircuitsMotorola and National Semiconductor 54HC00 and 54HC74 microcircuits were evaluated using CO-60 to determine their total dose radiation hardness. The devices were found to be radiation soft failing parametrically between 5 and 10 K rads and functionally between 20 and 40 K rads. The failures were bias dependent, relatively insensitive to dose rate, and only annealed moderately when left unbiased at room temperature.
Document ID
19850036429
Acquisition Source
Legacy CDMS
Document Type
Reprint (Version printed in journal)
Authors
Ropiak, S.
(NASA Goddard Space Flight Center Greenbelt, MD, United States)
Sahu, K.
(NASA Goddard Space Flight Center Greenbelt, MD, United States)
Cleveland, D.
(NASA Goddard Space Flight Center Greenbelt, MD, United States)
Date Acquired
August 12, 2013
Publication Date
December 1, 1984
Publication Information
Publication: IEEE Transactions on Nuclear Science
Volume: NS-31
ISSN: 0018-9499
Subject Category
Electronics And Electrical Engineering
Accession Number
85A18580
Distribution Limits
Public
Copyright
Other

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