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Review of the NASA Voyager spacecraft polycarbonate capacitor failure incidentThe premission failure of a Voyager spacecraft capacitor has prompted an investigation into the use of polycarbonate capacitors in high impedance circuits, during which capacitor failures were induced by thermal cycling together with extended periods at high temperature. Measurement of leakage path temperature coefficients indicates that there are two distinct leakage types whose mechanisms are complicated by movement within the capacitor during temperature changes. A novel system for pulse detection during capacitor burn-in and ramp testing has proven to be beneficial.
Document ID
19850044497
Acquisition Source
Legacy CDMS
Document Type
Reprint (Version printed in journal)
Authors
Ott, F. M.
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Yen, S. P. S.
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Somoano, R. B.
(California Institute of Technology, Jet Propulsion Laboratory, Pasadena CA, United States)
Date Acquired
August 12, 2013
Publication Date
February 1, 1985
Publication Information
Publication: IEEE Transactions on Electrical Insulation
Volume: EI-20
ISSN: 0018-9367
Subject Category
Electronics And Electrical Engineering
Accession Number
85A26648
Funding Number(s)
CONTRACT_GRANT: NAS8-33957
Distribution Limits
Public
Copyright
Other

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