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A thin film strain transducerA device has been developed for the purpose of measuring longitudinal strain in thin polyethylene films. This paper describes the design, development, calibration, and application of this unique transducer in a variety of low temperature environments. This thin, ring-shaped device has a low effective modulus so as not to interfere with the strain that would naturally occur in a thin film. It has a standard 350 ohm impedance which is compatible with most available bridge balance, amplification, and telemetry instrumentation. This transducer has been successfully used for viscoelastic material characterization experiments in the laboratory, as well as in flight measurements of strain on the surface of scientific balloons during inflation, launch, ascent, and float.
Document ID
19850047407
Acquisition Source
Legacy CDMS
Document Type
Conference Paper
Authors
Rand, J. L.
(Southwest Research Institute San Antonio, TX, United States)
Date Acquired
August 12, 2013
Publication Date
January 1, 1983
Subject Category
Instrumentation And Photography
Meeting Information
Meeting: International Instrumentation Symposium
Location: Albuquerque, NM
Start Date: May 2, 1983
End Date: May 6, 1983
Accession Number
85A29558
Funding Number(s)
CONTRACT_GRANT: NAS6-3077
Distribution Limits
Public
Copyright
Other

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