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The scattering of ultrasonic third sound from substrate surface defectsThe interaction of third sound with isolated surface defects is examined. Phase-inverted reflections are observed to occur at surface defects even when the wavelength of the third sound is much greater than the dimensions of the defect. The origin of the scattering mechanism is believed to be due to the change in the helium film thickness in the vicinity of the topological variations introduced by the presence of the surface defects. Data are obtained for ultrasonic frequencies in the 20-200 kHz range.
Document ID
19850053896
Acquisition Source
Legacy CDMS
Document Type
Reprint (Version printed in journal)
External Source(s)
Authors
Generazio, E. R.
(NASA Lewis Research Center Cleveland, OH; Pennsylvania State University, University Park, PA, United States)
Reed, R. W.
(United Technologies Research Center East Hartford, CT; Pennsylvania State University, University Park, PA, United States)
Date Acquired
August 12, 2013
Publication Date
January 1, 1984
Publication Information
Publication: Journal of Low Temperature Physics
Volume: 56
Issue: 3-4,
ISSN: 0022-2291
Subject Category
Acoustics
Accession Number
85A36047
Distribution Limits
Public
Copyright
Other

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