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A method of rapidly obtaining concentration-depth profiles from X-ray diffractionA broadened diffraction peak, or intensity band, is observed in the case diffraction from a nonhomogeneous phase in which the variations in compositions result in a range of lattice spacings. An intriguing aspect regarding the relationship between the X-ray diffraction band and the composition-depth profile is the hypersensitivity of the intensity band to the shape of the profile. A number of investigators have sought to use this sensitivity to construct high-precision profiles. Difficulties encountered are related to complications due to intensity broadening, and prohibitive computational requirements. Simulation techniques have provided the most accurate interpretation of the intensity band. However, the involved calculations have been prohibitively long. The present study discusses a technique which has simple computational requirements and is as accurate and flexible as the simulation techniques.
Document ID
19850061101
Acquisition Source
Legacy CDMS
Document Type
Reprint (Version printed in journal)
External Source(s)
Authors
Wiedemann, K. E.
(Analytical Services and Materials, Inc. Tabb, VA, United States)
Unnam, J.
(Analytical Services and Materials, Inc. Tabb, VA, United States)
Date Acquired
August 12, 2013
Publication Date
August 1, 1985
Publication Information
Publication: Journal of Applied Physics
Volume: 58
ISSN: 0021-8979
Subject Category
Instrumentation And Photography
Accession Number
85A43252
Distribution Limits
Public
Copyright
Other

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