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Mapping the Structure of Heterogeneous MaterialsImage-processing microdensitometer/Fourier analyzer yields statistics of subcomponent distribution. Nondestructive method for studying structure heterogeneous materials uses energy-dispersive X-ray analysis in scanning electron microscope. Scanning microdensitometer/Fourier analyzer (SMFA) is applied to SEM images to obtain statistics about sample structure. Method originally developed for studying effect on combustion of fine structure of composite solid propellants.
Document ID
19860000122
Acquisition Source
Legacy CDMS
Document Type
Other - NASA Tech Brief
Authors
Strand, L. D. (Caltech)
Cohen, N. S. (Caltech)
Hernan, M. A. (Caltech)
Date Acquired
August 12, 2013
Publication Date
May 1, 1986
Publication Information
Publication: NASA Tech Briefs
Volume: 10
Issue: 2
ISSN: 0145-319X
Subject Category
Physical Sciences
Report/Patent Number
NPO-16487
Accession Number
86B10122
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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