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Circuit for Lifetime and Surface-Recombination MeasurementsTest circuit for silicon solar cells suppresses spurious effects. New circuit increases accuracy of measurements of recombination lifetime and effective surface recombination velocity in silicon solar cell. Fast electronic switch, circuit grounds forward-biased cell so rapidly transient voltage to be measured not affected significantly.
Document ID
19860000482
Acquisition Source
Legacy CDMS
Document Type
Other - NASA Tech Brief
Authors
Lindholm, F. A.
(University of Florida)
Neugroschel, A.
(University of Florida)
Jung, T. W.
(University of Florida)
Date Acquired
August 12, 2013
Publication Date
November 1, 1986
Publication Information
Publication: NASA Tech Briefs
Volume: 10
Issue: 6
ISSN: 0145-319X
Subject Category
Electronic Components And Circuits
Report/Patent Number
NPO-16752
Accession Number
86B10482
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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