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Product assurance technology efforts: Technical accomplishmentsProduct assurance technology topics addressed include: wafer acceptance procedures, test chips, test structures, test chip methodology, fault models, and the Combined Release and Radiation Effects Satellite test chip.
Document ID
19860019784
Acquisition Source
Legacy CDMS
Document Type
Other
Date Acquired
August 12, 2013
Publication Date
June 1, 1985
Publication Information
Publication: Product Assurance Technology for Custom LSI(VLSI Electronics
Subject Category
Quality Assurance And Reliability
Accession Number
86N29256
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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