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Electrical, structural, and chemical characterization of silicon sheet materialsProgress on the electrical, structural, and chemical characterization of silicon sheet material is reported. In the study on high temperature deformation of dendritic web ribbon, experimental creep tests were performed in four point bending under constant load conditions, and unusual behavior was observed. Also, measurements of oxygen content in web ribbon were made. Two conclusions reached are creep behavior of web which is very different from any seen for single crystal silicon and oxygen level in web silicon which is near the saturation level at the melting point of silicon.
Document ID
19860019922
Acquisition Source
Legacy CDMS
Document Type
Conference Paper
Authors
Ast, D. G.
(Cornell Univ. Ithaca, NY, United States)
Hyland, S. L.
(Cornell Univ. Ithaca, NY, United States)
Date Acquired
August 12, 2013
Publication Date
June 1, 1985
Publication Information
Publication: JPL, Pasadena, Calif. Proceedings of the 25th Project Integration Meeting
Subject Category
Energy Production And Conversion
Accession Number
86N29394
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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