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Amorphous-silicon cell reliability testingThe work on reliability testing of solar cells is discussed. Results are given on initial temperature and humidity tests of amorphous silicon devices. Calibration and measurement procedures for amorphous and crystalline cells are given. Temperature stress levels are diagrammed.
Document ID
19860019932
Acquisition Source
Legacy CDMS
Document Type
Conference Paper
Authors
Lathrop, J. W. (Clemson Univ. SC, United States)
Date Acquired
August 12, 2013
Publication Date
June 1, 1985
Publication Information
Publication: JPL, Pasadena, Calif. Proceedings of the 25th Project Integration Meeting
Subject Category
Energy Production And Conversion
Accession Number
86N29404
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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IDRelationTitle19860019875Collected WorksProceedings of the 25th Project Integration Meeting
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