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Some strategies for quantitative scanning Auger electron microscopyThe general applicability of power law forms of the background in electron spectra is pointed out and exploited for background removal from under Auger peaks. This form of B(E) is found to be extremely sensitive to instrumental alignment and to fault-free construction - an observation which can be used to set up analyser configurations in an accurate way. Also, differences between N(E) and B(E) can be used to derive a spectrometer transmission function T(E). The questions of information density in an energy-analysing spatially-resolving instrument are addressed after reliable instrumental characterization has been established. Strategies involving ratio histograms, showing the population distribution of the ratio of a pair of Auger peak heights, composition scatter diagrams and windowed imaging are discussed and illustrated.
Document ID
19860058694
Acquisition Source
Legacy CDMS
Document Type
Reprint (Version printed in journal)
Authors
Browning, R.
(NASAStanford, Joint Institute for Surface and Microstructural Research, Moffett Field, CA; York, University Heslington, United Kingdom)
Peacock, D. C.
(NASA Ames Research Center Moffett Field, CA, United States)
Prutton, M.
(York, University Heslington, United Kingdom)
Date Acquired
August 12, 2013
Publication Date
January 1, 1985
Publication Information
Publication: Applications of Surface Science
Volume: 22-23
ISSN: 0378-5963
Subject Category
Instrumentation And Photography
Accession Number
86A43432
Funding Number(s)
CONTRACT_GRANT: NCC2-230
Distribution Limits
Public
Copyright
Other

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