Characterization and measurement of polymer wearAnalytical tools which characterize the polymer wear process are discussed. The devices discussed include: visual observation of polymer wear with SEM, the quantification with surface profilometry and ellipsometry, to study the chemistry with AES, XPS and SIMS, to establish interfacial polymer orientation and accordingly bonding with QUARTIR, polymer state with Raman spectroscopy and stresses that develop in polymer films using a X-ray double crystal camera technique.
Document ID
19860063667
Acquisition Source
Legacy CDMS
Document Type
Conference Proceedings
Authors
Buckley, D. H. (NASA Lewis Research Center Cleveland, OH, United States)
Aron, P. R. (NASA Lewis Research Center Cleveland, OH, United States)