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Determining Optical Axes of Uniaxial CrystalsPolarizing-microscope concept adapted for thick samples. Optical axis of crystal usually found by examining sample thinner than 1 mm between crossed polarizing plates. Frequently impractical to cut off small sample of crystal for testing, technique modified to accommodate large crystals. Ability to circumvent effect of birefringence has applications where laser beams must be transmitted through uniaxial crystals, as in laser diagnostics of contained flows in systems requiring windows for optical access.
Document ID
19870000063
Acquisition Source
Legacy CDMS
Document Type
Other - NASA Tech Brief
Authors
Schock, H. J.
(Cleveland State University)
Regan, C. A.
Lock, J. A.
Date Acquired
August 13, 2013
Publication Date
February 1, 1987
Publication Information
Publication: NASA Tech Briefs
Volume: 11
Issue: 2
ISSN: 0145-319X
Subject Category
Physical Sciences
Report/Patent Number
LEW-14452
Accession Number
87B10063
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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