NASA Logo

NTRS

NTRS - NASA Technical Reports Server

Back to Results
VLSI-Chip TesterCompact test set integrated in computer-aided design system. Test set performs functional tests on very-large-scale integrated (VLSI) circuits. Makes tests from points within VLSI chip as well as at input and output pins. Used for quality control and design; in latter capacity, checks internal logic functions on chip and feed results directly to computer-aided design system for correction. Also simulates operation of chip design before chip is made. VLSI Tester contains three power supplies, control logic, and standard multibus circuit board in aluminum chassis. Chassis fits under platform of microprobe station. Multibus board links tester to interactive terminals and to host computer.
Document ID
19870000164
Acquisition Source
Legacy CDMS
Document Type
Other - NASA Tech Brief
Authors
Deutsch, Leslie J.
(Caltech)
Olson, Erlend M.
(Caltech)
Date Acquired
August 13, 2013
Publication Date
April 1, 1987
Publication Information
Publication: NASA Tech Briefs
Volume: 11
Issue: 4
ISSN: 0145-319X
Subject Category
Electronic Systems
Report/Patent Number
NPO-16740
Accession Number
87B10164
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

Available Downloads

There are no available downloads for this record.
No Preview Available