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Separating Peaks in X-Ray SpectraDeconvolution algorithm assists in analysis of x-ray spectra from scanning electron microscopes, electron microprobe analyzers, x-ray fluorescence spectrometers, and like. New algorithm automatically deconvolves x-ray spectrum, identifies locations of spectral peaks, and selects chemical elements most likely producing peaks. Technique based on similarities between zero- and second-order terms of Taylor-series expansions of Gaussian distribution and of damped sinusoid. Principal advantage of algorithm: no requirement to adjust weighting factors or other parameters when analyzing general x-ray spectra.
Document ID
19870000170
Acquisition Source
Legacy CDMS
Document Type
Other - NASA Tech Brief
Authors
Nicolas, David
(Marshall Space Flight Center)
Taylor, Clayborne
(Marshall Space Flight Center)
Wade, Thomas
(Marshall Space Flight Center)
Date Acquired
August 13, 2013
Publication Date
April 1, 1987
Publication Information
Publication: NASA Tech Briefs
Volume: 11
Issue: 4
ISSN: 0145-319X
Subject Category
Physical Sciences
Report/Patent Number
MFS-26039
Accession Number
87B10170
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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