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Measuring Microwave EmissivitiesDicke radiometer and cryoload combined in emissivity determinations of mesh antennas. Newly developed measuring apparatus and procedure fills technological void in accurate determination of surface emissivities at microwave frequencies. Capable of measuring independently electromagnetic emissivity and/or intrinsic losses of surfaces, comprises radiometer, horn antenna, test section, and cryogenically cooled matched load.
Document ID
19870000389
Acquisition Source
Legacy CDMS
Document Type
Other - NASA Tech Brief
Authors
Blume, Hans-Juergen C.
(NASA Langley Research Center, Hampton, Va.)
Date Acquired
August 13, 2013
Publication Date
September 1, 1987
Publication Information
Publication: NASA Tech Briefs
Volume: 11
Issue: 8
ISSN: 0145-319X
Subject Category
Physical Sciences
Report/Patent Number
LAR-13455
Accession Number
87B10389
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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