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A system for the functional testing and simulation of custom and semicustom VLSI chipsA system for the functional testing and simulation of custom and semicustom very large scale integrated (VLSI) chips that are designed using the integrated UNIX-based computer-aided design (CAD) system is described. The testing and simulation system consists of two parts. One of these is a special purpose hardware device that is capable of controlling the digital imputs and outputs on a custom chip. This device, the Digital Microcircuit Functionality Tester (DMFT) system, can be operated by itself or in conjunction with the VAX host computer on the CAD system. The DMFT is integrated into a microprobe station so that these signals can be injected or read from nodes inside the chip, as well as at the pins. The second part of the system is a software package that is installed on the VAX. This software package, logic, includes a full-screen editor for developing chip test sequences and drivers for both the DMFT and the esim logic simulator.
Document ID
19870001610
Acquisition Source
Legacy CDMS
Document Type
Conference Paper
Authors
Olson, E. M.
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Deutsch, L. J.
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Date Acquired
August 13, 2013
Publication Date
August 15, 1986
Publication Information
Publication: The Telecommunications and Data Acquisition Report (date]
Subject Category
Electronics And Electrical Engineering
Accession Number
87N11043
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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