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FTIR characterization of advanced materialsThis paper surveys the application of Fourier transform infrared spectroscopy to the characterization of advanced materials. FTIR sampling techniques including internal and external reflectance and photoacoustic spectroscopy are discussed. Representative examples from the literature of the analysis of resins, fibers, prepregs and composites are reviewed. A discussion of several promising specialized FTIR techniques is also presented.
Document ID
19870024572
Acquisition Source
Legacy CDMS
Document Type
Reprint (Version printed in journal)
Authors
Young, P. R.
(NASA Langley Research Center Hampton, VA, United States)
Chang, A. C.
(NASA Langley Research Center Hampton, VA, United States)
Date Acquired
August 13, 2013
Publication Date
July 1, 1986
Publication Information
Publication: SAMPE Quarterly
Volume: 17
ISSN: 0036-0821
Subject Category
Instrumentation And Photography
Accession Number
87A11846
Distribution Limits
Public
Copyright
Other

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