Measurements of electron attachment lineshapes and cross sections at ultralow electron energies for c-C6F10, c-C6F12, C8F16 and 1,1,2-C2Cl3F3

Electron attachment cross sections are reported in the electron energy range 0-160 meV and at energy resolutions of 4.5-7.5 meV (FWHM) for the molecules c-C6F10 (perfluorocyclohexene), c-C6F12 (perfluoro-1,2-dimethylcyclobutane), C8F16 (perfluoro-1,3-dimethylcyclohexane) and 1,1,2-C2Cl3F3 (1,1,2-trichlorotrifluoroethane). Use is made of the Kr photoionization technique, and measured attachment lineshapes are converted to cross sections by normalization through attachment rate constants. Comparisons are made with attachment cross sections derived from swarm-measured rate constants. Similar to previous results in eight other molecules, the present four molecules exhibit resolution-limited onsets at a threshold consistent with an s-wave attachment behavior and with a neutral-negative-ion curve crossing at zero energy.