NASA Logo

NTRS

NTRS - NASA Technical Reports Server

Back to Results
A two wavelength holographic technique for simultaneous measurement of temperature and concentration during the solidification of two component systemsSimultaneous measurement of the temperature and concentration distribution within a fluid can be made using a 'two wavelength holographic' setup. The technique is successfully applied to the study of temperature, concentration, and flow fields in the melt of a transparent 'model alloy' during solidification.
Document ID
19870035443
Acquisition Source
Legacy CDMS
Document Type
Conference Paper
Authors
Ecker, A.
(NASA Marshall Space Flight Center Huntsville, AL, United States)
Date Acquired
August 13, 2013
Publication Date
January 1, 1987
Subject Category
Instrumentation And Photography
Report/Patent Number
AIAA PAPER 87-0579
Accession Number
87A22717
Distribution Limits
Public
Copyright
Other

Available Downloads

There are no available downloads for this record.
No Preview Available