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Photoelectrochemical fabrication of sawtooth gratings in n-GaAsA photoelectrochemical approach is employed to fabricate exceptionally smooth low-pitch grating structures consisting of polished single crystals of (100) oriented n-GaAs in a sawtooth profile. The depth of the edged features is controlled by monitoring the total coulombs passed, and the rate of etching is precisely controlled by the light intensity, minimizing diffusional gradients in the liquid which may impair the uniformity. Symmetrical grooves spaced 10 microns apart will have a depth of 7.14 microns, and typically, 10-20 percent less total charge is required.
Document ID
19870040137
Acquisition Source
Legacy CDMS
Document Type
Reprint (Version printed in journal)
Authors
Carrabba, Michael M.
(EIC, Inc. Norwood, MA, United States)
Nguyen, Nguyet M.
(EIC, Inc. Norwood, MA, United States)
Rauh, R. David
(EIC Laboratories, Inc. Norwood, MA, United States)
Date Acquired
August 13, 2013
Publication Date
December 15, 1986
Publication Information
Publication: Applied Optics
Volume: 25
ISSN: 0003-6935
Subject Category
Electronics And Electrical Engineering
Accession Number
87A27411
Distribution Limits
Public
Copyright
Other

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