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A parameterization of the effect of surface roughness on microwave emissionA simple model is developed to represent the net effect of surface roughness on the microwave emission from soils. The reflectivity of a rough soil surface is defined in a theoretical model that includes both coherent and incoherent reflectivities in terms of the statistical properties of the rough surface, i.e., the surface height standard deviation and its horizontal correlation length. It is shown that the rough surface reflectivity obtained from this theoretical model can be presented in a form that is simply the reflectivity of a smooth surface attenuated by a 'rough thickness'. It is found that the rough thickness can be parameterized as a function of the statistical slope ratio of a rough surface by a simple power-law relationship. Since the slope of a rough surface can be determined experimentally, the rough thickness can be quantitatively estimated from the parametric representation. Model calculations show that this simple model can provide reasonably accurate results of predicted brightness temperatures that agree well with field measurements within experimental uncertainty.
Document ID
19870059770
Acquisition Source
Legacy CDMS
Document Type
Reprint (Version printed in journal)
Authors
Mo, Tsan
(Computer Sciences Corp. Beltsville, MD, United States)
Schmugge, Thomas J.
(NASA Goddard Space Flight Center Greenbelt; USDA, Hydrology Laboratory, Beltsville, MD, United States)
Date Acquired
August 13, 2013
Publication Date
July 1, 1987
Publication Information
Publication: IEEE Transactions on Geoscience and Remote Sensing
Volume: GE-25
ISSN: 0196-2892
Subject Category
Earth Resources And Remote Sensing
Accession Number
87A47044
Distribution Limits
Public
Copyright
Other

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