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Microwave Deflection SensorDoppler-radar instrument measures small deflections or vibrations of reflecting surface. Acting as interferometric micrometer, instrument includes combination of analog and digital circuits measuring change in phase of radar return due to movement of reflecting surface along signal-propagation path. Includes homodyne Doppler-radar transceiver and digital signal-processing circuitry to measure change in phase shift as target deflects.
Document ID
19880000569
Acquisition Source
Legacy CDMS
Document Type
Other - NASA Tech Brief
Authors
Shores, Paul (NASA Lyndon B. Johnson Space Center, Houston, TX.)
Kobayashi, Herb (NASA Lyndon B. Johnson Space Center, Houston, TX.)
Ngo, Phong (NASA Lyndon B. Johnson Space Center, Houston, TX.)
Lichtenberg, C. L. (NASA Lyndon B. Johnson Space Center, Houston, TX.)
Date Acquired
August 13, 2013
Publication Date
December 1, 1988
Publication Information
Publication: NASA Tech Briefs
Volume: 12
Issue: 11
ISSN: 0145-319X
Subject Category
Electronic Systems
Report/Patent Number
MSC-20974
Accession Number
88B10569
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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