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Measurement of emissivity of industrial surfaces using a simple methodTo detect emissivity, the drop in temperature of the sample undergoing radiation exchange with the wall in an evacuated space is measured over a given period. In this manner, emissivities of various synthetic resin lacquers, metals, and metallic coatings were measured. Once the emissivity is known, the same method can be used to detect specific heat and the head condition of gases.
Document ID
19880012746
Acquisition Source
Legacy CDMS
Document Type
Reprint (Version printed in journal)
Authors
Dallmeyer, H.
(NASA Headquarters Washington, DC United States)
Date Acquired
September 5, 2013
Publication Date
April 1, 1988
Subject Category
Inorganic And Physical Chemistry
Report/Patent Number
NASA-TT-20165
NAS 1.77:20165
Accession Number
88N22130
Funding Number(s)
CONTRACT_GRANT: NASW-4307
Distribution Limits
Public
Copyright
Public Use Permitted.
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