NASA Logo

NTRS

NTRS - NASA Technical Reports Server

Collections About News Help Login
Back to Results
Self- and foreign-gas broadening of ethane lines determined from diode laser measurements at 12 micronsSelf- and foreign-gas broadening of ethane lines have been measured in the nu9 band at 12 microns. A coefficient of 0.125 per cm atm was determined for self broadening. Foreign-gas broadening coefficients determined are (in per cm atm) 0.090 for N2, 0.069 for He, 0.068 for Ar, 0.108 for H2, and 0.096 for CH4. Results are given for a sample temperature of 296 K.
Document ID
19880028368
Acquisition Source
Legacy CDMS
Document Type
Reprint (Version printed in journal)
External Source(s)
doi:10.1016/0022-4073(87)90083-5
Authors
Blass, W. E. (Tennessee, University Knoxville, United States)
Halsey, G. W. (NASA Goddard Space Flight Center Greenbelt, MD; Tennessee, University, Knoxville, United States)
Jennings, D. E. (NASA Goddard Space Flight Center Greenbelt, MD, United States)
Date Acquired
August 13, 2013
Publication Date
September 1, 1987
Publication Information
Publication: Journal of Quantitative Spectroscopy and Radiative Transfer
Volume: 38
ISSN: 0022-4073
Subject Category
Atomic And Molecular Physics
Accession Number
88A15595
Distribution Limits
Public
Copyright
Other

Available Downloads

There are no available downloads for this record.

Related Records

There are no records associated with this record.
No Preview Available