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Bit-error-rate testing of high-power 30-GHz traveling-wave tubes for ground-terminal applicationsTests were conducted at NASA Lewis to measure the bit-error-rate performance of two 30-GHz 200-W coupled-cavity traveling-wave tubes (TWTs). The transmission effects of each TWT on a band-limited 220-Mbit/s SMSK signal were investigated. The tests relied on the use of a recently developed digital simulation and evaluation system constructed at Lewis as part of the 30/20-GHz technology development program. This paper describes the approach taken to test the 30-GHz tubes and discusses the test data. A description of the bit-error-rate measurement system and the adaptations needed to facilitate TWT testing are also presented.
Document ID
19880032554
Acquisition Source
Legacy CDMS
Document Type
Reprint (Version printed in journal)
Authors
Shalkhauser, Kurt A.
(NASA Lewis Research Center Cleveland, OH, United States)
Date Acquired
August 13, 2013
Publication Date
December 1, 1987
Publication Information
Publication: IEEE Transactions on Electron Devices
Volume: ED-34
ISSN: 0018-9383
Subject Category
Electronics And Electrical Engineering
Accession Number
88A19781
Distribution Limits
Public
Copyright
Other

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