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Observations and consequences of nonuniform aluminum concentrations in the channel regions of AlGaAs channeled-substrate-planar lasersCompositional changes in the n-clad layer within the channel region of channel substrate planar (CSP) type semiconductor lasers have been observed. As a consequece, a large optical cavity (LOC) or an enhanced substrate loss (ESL) version of the CSP geometry may result, both of which may have significantly different characteristics from those of a conventional CSP laser. The CSP-LOC generally has a larger near-field spot size, while the ESL-CSP is characterized by an off-axis, asymmetric far-field pattern.
Document ID
19880033281
Acquisition Source
Legacy CDMS
Document Type
Reprint (Version printed in journal)
Authors
Evans, Gary A.
(RCA David Sarnoff Research Center Princeton, NJ, United States)
Goldstein, Bernard
(Solarex Corp. Newtown, PA, United States)
Butler, Jerome K.
(Southern Methodist University Dallas, TX, United States)
Date Acquired
August 13, 2013
Publication Date
November 1, 1987
Publication Information
Publication: IEEE Journal of Quantum Electronics
Volume: QE-23
ISSN: 0018-9197
Subject Category
Lasers And Masers
Accession Number
88A20508
Funding Number(s)
CONTRACT_GRANT: NAS1-17441
Distribution Limits
Public
Copyright
Other

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