Reliability of photovoltaic modulesIn order to assess the reliability of photovoltaic modules, four categories of known array failure and degradation mechanisms are discussed, and target reliability allocations have been developed within each category based on the available technology and the life-cycle-cost requirements of future large-scale terrestrial applications. Cell-level failure mechanisms associated with open-circuiting or short-circuiting of individual solar cells generally arise from cell cracking or the fatigue of cell-to-cell interconnects. Power degradation mechanisms considered include gradual power loss in cells, light-induced effects, and module optical degradation. Module-level failure mechanisms and life-limiting wear-out mechanisms are also explored.
Document ID
19880034379
Acquisition Source
Legacy CDMS
Document Type
Conference Paper
Authors
Ross, R. G., Jr. (California Institute of Technology Jet Propulsion Laboratory, Pasadena, United States)