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Extraction of spectral hemispherical reflectance (albedo) of surfaces from nadir and directional reflectance dataA radiative transfer model is used to investigate how the error of spectral hemispherical reflectance data obtained from nadir reflectance values varies with wavelength, solar zenith angle, leaf area index, and leaf orientation distribution. Several techniques employing multiple off-nadir view angles taken in azimuth planes are found to accurately infer spectral hemispherical reflectances, and to be well suited to sensor systems that scan in a known azimuth plane or view fore and aft in a known azimuth plane. The effects of errors in hemispherical reflectance on terrestrial energy budget and productivity calculations is also considered.
Document ID
19880040782
Acquisition Source
Legacy CDMS
Document Type
Reprint (Version printed in journal)
Authors
Kimes, D. S.
(NASA Goddard Space Flight Center Greenbelt, MD, United States)
Sellers, P. J.
(Maryland, University College Park, United States)
Diner, D. J.
(California Institute of Technology Jet Propulsion Laboratory, Pasadena, United States)
Date Acquired
August 13, 2013
Publication Date
December 1, 1987
Publication Information
Publication: International Journal of Remote Sensing
Volume: 8
ISSN: 0143-1161
Subject Category
Earth Resources And Remote Sensing
Accession Number
88A28009
Distribution Limits
Public
Copyright
Other

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