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Index of refraction of GaAs-Al(x)Ga(1-x)As superlattices and multiple quantum wellsA theoretical study of the index of refraction of superlattices and its variation as a function of frequency and the superlattice parameters, i.e., layer width and AlAs composition, is presented. Gamma-region exciton and valence-band mixing effects are included in the model. It is found that these two effects have an important influence on the value of the index of refraction and that superstructure effects rapidly decrease for energies greater than the superlattice potential barriers. Because of the quasi-two-dimensional character of the Gamma-region excitons, the results indicate that the superlattice index of refraction can vary by about two percent at the quantized, bound-exciton, transition energies. Overall, the theoretical results are in good agreement with the experimental data.
Document ID
19880041399
Acquisition Source
Legacy CDMS
Document Type
Reprint (Version printed in journal)
Authors
Kahen, K. B.
(Illinois Univ. Urbana, IL, United States)
Leburton, J. P.
(Illinois, University Urbana, United States)
Date Acquired
August 13, 2013
Publication Date
January 1, 1987
Publication Information
Publication: Superlattices and Microstructures
Volume: 3
Issue: 3, 19
ISSN: 0749-6036
Subject Category
Solid-State Physics
Accession Number
88A28626
Distribution Limits
Public
Copyright
Other

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