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Direct investigation of subsurface interface electronic structure by ballistic-electron-emission microscopyA new technique for spectroscopic investigation of subsurface interface electronic structure has been developed. The method, ballistic-electron-emission microscopy (BEEM), is based on scanning tunneling microscopy. BEEM makes possible, for the first time, direct imaging of subsurface interface properties with nanometer spatial resolution. The first application of BEEM to subsurface Schottky-barrier interfaces is reported.
Document ID
19880044042
Acquisition Source
Legacy CDMS
Document Type
Reprint (Version printed in journal)
Authors
Kaiser, W. J.
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Bell, L. D.
(California Institute of Technology Jet Propulsion Laboratory, Pasadena, United States)
Date Acquired
August 13, 2013
Publication Date
April 4, 1988
Publication Information
Publication: Physical Review Letters
Volume: 60
ISSN: 0031-9007
Subject Category
Solid-State Physics
Accession Number
88A31269
Distribution Limits
Public
Copyright
Other

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