Sources of error in heterodyne moire deflectometry

Alignment problems, and the accompanying errors, in heterodyne moire deflectometry are considered. A change in the x-directed offset between two states of a phase object causes a constant phase error, and it is noted that the relative x coordinate of the two photographic plates (the two states of the phase object) must be positioned typically within 1 micron to avoid a detectable offset. Possible solutions for assuring the relative alignment of the two deflectograms are considered, including a sandwich technique and a two-color double-exposure implementation.