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Absolute gain measurement of microstrip antennas under mismatched conditionsThe gain of a single microstrip patch and a two-layer parasitic array is measured using the image method under mismatched conditions. This method produces accurate results, even in the case of low-gain microstrip antennas. The advantages of this method over the gain comparison technique are discussed.
Document ID
19880060722
Acquisition Source
Legacy CDMS
Document Type
Reprint (Version printed in journal)
Authors
Lee, R. Q. (NASA Lewis Research Center Cleveland, OH, United States)
Baddour, M. F. (NASA Lewis Research Center Cleveland, OH, United States)
Date Acquired
August 13, 2013
Publication Date
April 28, 1988
Publication Information
Publication: Electronics Letters
Volume: 24
ISSN: 0013-5194
Subject Category
Communications And Radar
Accession Number
88A47949
Distribution Limits
Public
Copyright
Other

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