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Photoelastic measurements of residual stresses for NDEPhotoelastic measurements of residual strains are used extensively in the QC and inspection of transparent materials. A new method of measurements, based on Spectral Contents Analysis, is described in this paper. The method uses a personal computer for photoelastic data acquisition, eliminating personal skill and subjectivity. the new tool should make the measurements of residual strains for QC simpler and more reliable.
Document ID
19880065326
Acquisition Source
Legacy CDMS
Document Type
Conference Paper
Authors
Redner, Alex S.
(Strainoptic Technologies, Inc. North Wales, PA, United States)
Date Acquired
August 13, 2013
Publication Date
January 1, 1988
Subject Category
Structural Mechanics
Meeting Information
Meeting: International Conference on Photomechanics and Speckle Metrology
Location: San Diego, CA
Country: United States
Start Date: August 17, 1987
End Date: August 20, 1987
Sponsors: SPIE
Accession Number
88A52553
Funding Number(s)
CONTRACT_GRANT: NAS2-12351
Distribution Limits
Public
Copyright
Other

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